Local electronic transport across probe/ionic conductor interface in scanning probe microscopy

Charge carrier transport through the probe-sample junction can have substantial consequences for outcomes of electrical and electromechanical atomic-force-microscopy (AFM) measurements. For understanding physical processes under probe, we carried out conductive-AFM (C-AFM) measurements local current-voltage (I-V) curves as well their derivatives on samples a mixed ionic-electronic conductor Li1-xMn2O4 developed an analytical framework data analysis. The implemented approach discriminates between contributions highly resistive sample surface layer bulk with account ion redistribution in field probe. It was found that, increasing probe voltage, conductance mechanism transforms from Pool-Frenkel to space-charge-limited current. significantly alters dynamics which leads, particular, decrease effective AFM signal associated ionic motion sample. be applied analysis electronic mechanisms across probe/sample interface uncover role charge electric distribution, mechanical, other responses broad spectrum conducting materials.